1. Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. (October 2020) Authors: Fan, Shu-Kai S.; Hsu, Chia-Yu; Jen, Chih-Hung; Chen, Kuan-Lung; Juan, Li-Ting Journal: Advanced engineering informatics Issue: Volume 46(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes. (October 2020) Authors: Fan, Shu-Kai S.; Hsu, Chia-Yu; Jen, Chih-Hung; Chen, Kuan-Lung; Juan, Li-Ting Journal: Advanced engineering informatics Issue: Volume 46(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗