Author/Creator: Joubert, E. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Joubert, E.

1. Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures. (September 2017)

Authors:: Moultif, N.; Joubert, E.; Masmoudi, M.; Latry, O.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 243
Record Type:: Journal Article
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2. Development of chemical-based reference standards for rooibos and honeybush aroma lexicons. (January 2020)

Authors:: du Preez, B.V.P.; de Beer, D.; Moelich, E.I.; Muller, M.; Joubert, E.
Journal:: Food research international
Issue:: Volume 127(2020)
Page Start:
Record Type:: Journal Article
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3. PSP with trained assessors as alternative for descriptive analysis of a product with a complex sensory profile. (January 2023)

Authors:: Moelich, E.I.; Muller, M.; Kidd, M.; van der Rijst, M.; Næs, T.; Joubert, E.
Journal:: Food quality and preference
Issue:: Volume 103(2023)
Page Start:
Record Type:: Journal Article
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4. Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating. (November 2021)

Authors:: Moultif, N.; Duguay, S.; Latry, O.; Ndiaye, M.; Joubert, E.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
Page Start:
Record Type:: Journal Article
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5. S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application. (September 2019)

Authors:: Moultif, N.; Latry, O.; Ndiaye, M.; Neveu, T.; Joubert, E.; Moreau, C.; Goupy, J-F.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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