1. A Simple Approach for Thickness Measurements Using Electron Probe Microanalysis. (April 2021) Authors: Essani, Mouad; Krawiec, Victor; Brackx, Emmanuelle; Excoffier, Emmanuel; Jonnard, Philippe Journal: Microscopy and microanalysis Issue: Volume 27:Number 2(2021) Page Start: 337 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Co/Mo2C multilayer as X‐ray mirror: Optical and thermal performances. Issue 4 (4th December 2013) Authors: Yuan, Yanyan; Guen, Karine Le; André, Jean‐Michel; Wang, Zhanshan; Li, Haochuan; Zhu, Jingtao; Mény, Christian; Giglia, Angelo; Nannarone, Stefano; Jonnard, Philippe Journal: Physica status solidi Issue: Volume 251:Issue 4(2014:Apr.) Page Start: 803 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Composition and optical properties of chromium oxynitride films. (25th July 2022) Authors: Wang, Jin; Tu, Yuchun; Yuan, Yanyan; Qian, Han; Jonnard, Philippe; Lan, Rui Journal: Surface and interface analysis Issue: Volume 54:Number 11(2022) Page Start: 1142 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Depth analysis of Al/ZrC interfaces using SIMS and x‐ray reflectivity. (17th April 2018) Authors: Modi, Mohammed H.; Sinha, Mangalika; Bose, Aniruddha; Singh, Amol; Jonnard, Philippe Journal: Surface and interface analysis Issue: Volume 50:Number 11(2018) Page Start: 1239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Electron probe microanalysis of light elements: Improvements in the measurement and signal extraction methods. (11th May 2022) Authors: Schweizer, Pia; Brackx, Emmanuelle; Jonnard, Philippe Journal: X-ray spectrometry Issue: Volume 51:Number 4(2022) Page Start: 403 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Issue 1 (December 2017) Authors: Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan Journal: Scientific reports Issue: Volume 7:Issue 1(2017) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Improving the soft X‐ray reflectivity of Cr/Ti multilayers by co‐deposition of B4C. (9th October 2020) Authors: Zhu, Jingtao; Zhang, Jiayi; Li, Haochuan; Tu, Yuchun; Chen, Jinwen; Wang, Hongchang; Dhesi, Sarnjeet S.; Cui, Mingqi; Zhu, Jie; Jonnard, Philippe Journal: Journal of synchrotron radiation Issue: Volume 27:Part 6(2020) Page Start: 1614 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Inter‐laboratory comparison of a WDS–EDS quantitative X‐ray microanalysis of a metallic glass. (1st December 2014) Authors: Jonnard, Philippe; Brisset, François; Robaut, Florence; Wille, Guillaume; Ruste, Jacky Journal: X-ray spectrometry Issue: Volume 44:Number 1(2015:Jan./Feb.) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Soft X‐ray characterization of ion beam sputtered magnesium oxide (MgO) thin film. (10th May 2018) Authors: Sinha, Mangalika; Gupta, Mukul; Jonnard, Philippe; Modi, Mohammed H. Journal: Surface and interface analysis Issue: Volume 50:Number 11(2018) Page Start: 1145 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Standardless Quantitative EPMA of Microparticles with Irregular Shapes. (August 2020) Authors: Essani, Mouad; Brackx, Emmanuelle; Jonnard, Philippe; Excoffier, Emmanuel Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 504 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗