1. P2Atom Probe Tomography (APT) combined with in-situ TEM; 3D Analysis for Electronic Memory Device Technology. (30th October 2015) Authors: Lee, J.H.; Jeong, W.Y; Park, C. G. Journal: Microscopy Issue: Volume 64(2015)Supplement 1 Page Start: i3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗