P2Atom Probe Tomography (APT) combined with in-situ TEM; 3D Analysis for Electronic Memory Device Technology. (30th October 2015)

Record Type:: Journal Article
Title:: P2Atom Probe Tomography (APT) combined with in-situ TEM; 3D Analysis for Electronic Memory Device Technology. (30th October 2015)
Main Title:: P2Atom Probe Tomography (APT) combined with in-situ TEM; 3D Analysis for Electronic Memory Device Technology
Authors:: Lee, J.H.
Jeong, W.Y
Park, C. G.
Abstract:
Is Part Of:: Microscopy. Volume 64(2015)Supplement 1
Journal:: Microscopy
Issue:: Volume 64(2015)Supplement 1
Issue Display:: Volume 64, Issue 1 (2015)
Year:: 2015
Volume:: 64
Issue:: 1
Issue Sort Value:: 2015-0064-0001-0000
Page Start:: i3
Page End:: i3
Publication Date:: 2015-10-30
Subjects:: Microscopy -- Periodicals
502.825
Journal URLs:: http://jmicro.oxfordjournals.org/ ↗
http://ukcatalogue.oup.com/ ↗
DOI:: 10.1093/jmicro/dfv063 ↗
Languages:: English
ISSNs:: 2050-5698
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 12704.xml