1. Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography. Issue 21 (29th September 2017) Authors: Dyck, Ondrej; Leonard, Donovan N.; Edge, Lisa F.; Jackson, Clayton A.; Pritchett, Emily J.; Deelman, Peter W.; Poplawsky, Jonathan D. Journal: Advanced materials interfaces Issue: Volume 4:Issue 21(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017). Issue 21 (21st November 2017) Authors: Dyck, Ondrej; Leonard, Donovan N.; Edge, Lisa F.; Jackson, Clayton A.; Pritchett, Emily J.; Deelman, Peter W.; Poplawsky, Jonathan D. Journal: Advanced materials interfaces Issue: Volume 4:Issue 21(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Metamorphic materials for quantum computing. (14th March 2016) Authors: Deelman, Peter W.; Edge, Lisa F.; Jackson, Clayton A. Journal: MRS bulletin Issue: Volume 41:Number 3(2016:Mar.) Page Start: 224 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗