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You searched for: Author/Creator Inge, Shashank V.- Inge, Shashank V. [remove] 2
- 620.11 1
- 621.38152 1
- LER Line Edge Roughness -- NWFET Nanowire Field Effect Transistor 1
- Materials science -- Periodicals 1
- NWFET -- Line edge roughness -- Analytical model -- mathematical model 1
- Semiconducteurs -- Périodiques 1
- Semiconductors -- Periodicals 1
- density functional theory -- electronic structure -- GaN -- nanoribbons -- negative differential resistance 1