1. Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. (10th January 2019) Authors: Tolstogouzov, Alexander; Drozdov, Mikhail N.; Belykh, Sergey F.; Gololobov, Gennady P.; Ieshkin, Alexei E.; Mazarov, Paul; Suvorov, Dmitriy V.; Fu, Dejun; Pelenovich, Vasiliy; Zeng, Xiaomei; Zuo, Wenbin Journal: Rapid communications in mass spectrometry Issue: Volume 33:Number 3(2019) Page Start: 323 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗