1. Ga‐focused ion beam time‐of‐flight secondary ion mass spectrometer analysis of the grain boundary segregation/precipitation of boron in steel. (14th February 2014) Authors: Tanaka, Tomohito; Fujishiro, Taishi; Shigesato, Genichi; Hayashi, Shun‐ichi Journal: Surface and interface analysis Issue: Volume 46:Number 5(2014) Page Start: 297 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Oxygen accumulation effect for depth profiling of thin‐multilayered sample using low‐energy oxygen ion beam. (17th July 2012) Authors: Nishinomiya, Suguru; Kubota, Naoyoshi; Hayashi, Shun‐ichi; Takenaka, Hisataka Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 107 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Selective detection of polyaromatic hydrocarbons on diesel exhaust particles using sputtered neutral mass spectrometry. (17th May 2013) Authors: Sakamoto, Tetsuo; Ohishi, Kenji; Hayashi, Shun‐ichi; Fujii, Masaaki Journal: Surface and interface analysis Issue: Volume 45:Number 8(2013:Aug.) Page Start: 1309 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗