1. Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces. (August 2020) Authors: Kollmer, Felix; Pirkl, Alexander; Kayser, Sven; Arlinghaus, Henrik; Moellers, Rudolf; Havercroft, Nathan; Niehuis, Ewald Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 76 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Recent Innovations and Perspectives in TOF-SIMS. (August 2022) Authors: Kollmer, Felix; Pirkl, Alexander; Arlinghaus, Henrik; Möllers, Rudolf; Havercroft, Nathan; Niehuis, Ewald Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 942 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗