Author/Creator: Han, Z.S. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Han, Z.S.

1. A current model for FOI FinFETs with back-gate bias modulation. (November 2021)

Authors:: Liu, F.Y.; Zhang, X.; Zhang, F.Y.; Li, B.; Li, B.H.; Huang, Y.; Wang, G.Q.; Chen, S.Y.; Zhang, Q.Z.; Yin, H.X.; Luo, J.J.; Han, Z.S.; Guo, Y.F.; Cristoloveanu, S.
Journal:: Solid-state electronics
Issue:: Volume 185(2021)
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Record Type:: Journal Article
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2. Pseudo-MOSFET transient behavior: Experiments, model, substrate and temperature effect. (December 2021)

Authors:: Zhang, X.; Liu, F.Y.; Li, B.; Li, B.H.; Luo, J.J.; Han, Z.S.; Arsalan, M.; Wan, J.; Cristoloveanu, S.
Journal:: Solid-state electronics
Issue:: Volume 186(2021)
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Record Type:: Journal Article
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3. Revisited parasitic bipolar effect in FDSOI MOSFETs: Mechanism, gain extraction and circuit applications. (November 2021)

Authors:: Wang, G.Q.; Liu, F.Y.; Li, B.; Luo, J.J.; Huang, Y.; Su, X.H.; Han, Z.S.; Zhang, J.J.; Wang, Y.C.; Wu, C.N.; Zhang, J.M.; Cristoloveanu, S.
Journal:: Solid-state electronics
Issue:: Volume 185(2021)
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Record Type:: Journal Article
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4. Study on the high-temperature triggering and holding characteristics of PDSOI SCR devices. (November 2021)

Authors:: Wang, J.X.; Zhao, F.Z.; Ni, T.; Li, D.L.; Gao, L.C.; Wang, J.J.; Li, X.J.; Zeng, C.B.; Luo, J.J.; Han, Z.S.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
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Record Type:: Journal Article
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