1. Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment. (September 2018) Authors: Li, B.; Huang, Y.; Wu, J.; Huang, Y.; Li, B.; Zhang, Q.; Yang, L.; Wan, F.; Luo, J.; Han, Z.; Yin, H. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 969 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Impacts of carbon ions on SEU in SOI SRAM. (November 2021) Authors: Gao, J.; Zhang, Q.; Xi, K.; Li, B.; Li, B.; Wang, C.; Lu, P.; Wang, K.; Zhang, G.; Zhao, F.; Li, J.; Hao, L.; Wang, L.; Luo, J.; Han, Z.; Liu, J.; Guo, G. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Proton and light ions induced SEU effect in a SOI SRAM with gold plated lid. (September 2019) Authors: Gao, J.; Zhang, Q.; Li, B.; Xi, K.; Li, B.; Liu, F.; Wang, C.; Liu, H.; Zhao, F.; Zeng, C.; Luo, J.; Han, Z.; Liu, J.; Guo, G. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Single-event induced failure mode of PWM in DC/DC converter. (November 2020) Authors: Gao, J.; Li, C.; Li, B.; Li, B.; Zhao, F.; Li, J.; Zhang, G.; Wang, C.; Zeng, C.; Cui, S.; Wu, Q.; Luo, J.; Han, Z.; Liu, J.; Ye, T. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. The total ionizing dose response of a DSOI 4Kb SRAM. (September 2017) Authors: Li, B.; Wu, J.; Gao, J.; Kuang, Y.; Li, J.; Zhao, X.; Zhao, K.; Han, Z.; Luo, J. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 714 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗