1. 60‐4: Mechanically Robust High‐Performance Flexible Oxide TFTs with Imbedded Buried CNT Electrode for Bendable Displays. Issue 1 (30th May 2018) Authors: Billah, Mohammad Masum; Park, Min Sang; Saha, Jewel Kumer; Hasan, Md Mehedi; Han, Ji-Ung; Hwang, Mangyu; Jang, Jin Journal: Digest of technical papers Issue: Volume 49:Issue 1(2018) Page Start: 800 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. P‐16: Implementation of TCAD Simulation of a‐IGZO Corbino TFTs for AMOLED Application. Issue 1 (2nd June 2017) Authors: Han, Ji-Ung; Lee, Won-Seok; Tak, Nam-Kyun; Choi, In-Chol; Kim, Jin-young; Hwang, Man-gyu; Geng, Di; Choe, Younwoo; Jang, Jin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1284 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. P‐16: Implementation of TCAD Simulation of a‐IGZO Corbino TFTs for AMOLED Application. Issue 1 (May 2017) Authors: Han, Ji-Ung; Lee, Won-Seok; Tak, Nam-Kyun; Choi, In-Chol; Kim, Jin-young; Hwang, Man-gyu; Geng, Di; Choe, Younwoo; Jang, Jin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1284 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. P‐22: Spice Model for Detection of Dynamic Threshold Voltage Shift During Failure Analysis of Oxide TFT‐Based AMD Gate Drivers. Issue 1 (2nd June 2017) Authors: Lee, Won-Seok; Kang, Jong-Suk; Tak, Nam-Kyun; Choi, In-Chol; Kim, Jin-Young; Han, Ji-Ung; Choi, Jin-Hyung; Mativenga, Mallory; Hwang, Man-Gyu Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1307 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. P‐22: Spice Model for Detection of Dynamic Threshold Voltage Shift During Failure Analysis of Oxide TFT‐Based AMD Gate Drivers. Issue 1 (May 2017) Authors: Lee, Won-Seok; Kang, Jong-Suk; Tak, Nam-Kyun; Choi, In-Chol; Kim, Jin-Young; Han, Ji-Ung; Choi, Jin-Hyung; Mativenga, Mallory; Hwang, Man-Gyu Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1307 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. P‐78: Calibration of a‐InGaZnO Thin Film Transistors with Various Channel Lengths using TCAD Simulation. Issue 1 (2nd June 2017) Authors: Tak, Nam-Kyun; Lee, Won-Seok; Kim, Sae-Han; Choi, In-Chol; Kim, Jin-Young; Han, Ji-Ung; Choi, Jin-Hyung; Hwang, Man-Gyu; Um, Jae Gwang; Lee, Suhui; Billah, Mohammad Masum; Jang, Jin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1536 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. P‐78: Calibration of a‐InGaZnO Thin Film Transistors with Various Channel Lengths using TCAD Simulation. Issue 1 (May 2017) Authors: Tak, Nam-Kyun; Lee, Won-Seok; Kim, Sae-Han; Choi, In-Chol; Kim, Jin-Young; Han, Ji-Ung; Choi, Jin-Hyung; Hwang, Man-Gyu; Um, Jae Gwang; Lee, Suhui; Billah, Mohammad Masum; Jang, Jin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1536 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗