1. Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach /: A Physics of Failure Approach. (2020) Authors: Lall, Pradeep; Pecht, Michael G; Hakim, Edward B Record Type: Book Extent: 1 online resource (336 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Influence of temperature on microelectronics and system reliability : a physics of failure approach /: a physics of failure approach. (2020) Authors: Lall, Pradeep; Pecht, Michael; Hakim, Edward B Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗