Influence of temperature on microelectronics and system reliability : a physics of failure approach /: a physics of failure approach. (2020)

Record Type:
Book
Title:
Influence of temperature on microelectronics and system reliability : a physics of failure approach /: a physics of failure approach. (2020)
Main Title:
Influence of temperature on microelectronics and system reliability : a physics of failure approach
Further Information:
Note: Pradeep Lall, Michael G. Pecht, Edward B. Hakim.
Authors:
Lall, Pradeep
Pecht, Michael
Hakim, Edward B
Edition:
1st
Publisher Details:
Boca Raton : CRC Press
Publication Date:
2020
Extent:
1 online resource
Subjects:
621.381
Microelectronics -- Materials -- Thermal properties
Microelectronic packaging
Electronic apparatus and appliances -- Reliability
Languages:
English
ISBNs:
9780429605598
Related ISBNs:
9780429611117
9780429600074
9780138750879
Notes:
Note: Description based on CIP data; resource not viewed.
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.740554
Ingest File:
15_023.xml