Author/Creator: Hajjar, Jean-Jacques - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Hajjar, Jean-Jacques

1. Compact failure modeling for devices subject to electrostatic discharge stresses – A review pertinent to CMOS reliability simulation. Issue 1 (January 2015)

Authors:: Miao, Meng; Zhou, Yuanzhong; Salcedo, Javier A.; Hajjar, Jean-Jacques; Liou, Juin J.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 1(2015)
Page Start:: 15
Record Type:: Journal Article
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2. Design and characterization of ESD solutions with EMC robustness for automotive applications. Issue 11 (November 2015)

Authors:: Xi, Yunfeng; Salcedo, Javier A.; Zhou, Yuanzhong; Liou, Juin J.; Hajjar, Jean-Jacques
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 11(2015)
Page Start:: 2236
Record Type:: Journal Article
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3. ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. (December 2017)

Authors:: Dong, Aihua; Salcedo, Javier A.; Parthasarathy, Srivatsan; Zhou, Yuanzhong; Luo, Sirui; Hajjar, Jean-Jacques; Liou, Juin J.
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 201
Record Type:: Journal Article
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