1. Local strain and defects in silicon wafers due to nanoindentation revealed by full‐field X‐ray microdiffraction imaging. (25th June 2015) Authors: Li, Z. J.; Danilewsky, A. N.; Helfen, L.; Mikulik, P.; Haenschke, D.; Wittge, J.; Allen, D.; McNally, P.; Baumbach, T. Journal: Journal of synchrotron radiation Issue: Volume 22:Part 4(2015) Page Start: 1083 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗