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4. Depletion of superjunction power MOSFETs visualized by electron beam induced current and voltage contrast measurements. Issue 11 (8th August 2014)

6. Electrically detected magnetic resonance study on defects in Si pn‐junctions created by proton implantation. Issue 11 (8th August 2014)

7. High dose proton implantations into silicon: a combined EBIC, SRP and TEM study. Issue 11 (8th August 2014)

8. Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface. Issue 12 (3rd April 2018)