1. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. (22nd March 2019) Authors: Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Llacer, C. Lacasta; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullán, M.; Unno, Y. Journal: Journal of instrumentation Issue: Volume 14:Number 3(2019) Page Start: P03024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Results of an electron beam test with prototype silicon sensors manufactured by Infineon Technologies Austria AG. (8th May 2015) Authors: Treberspurg, W.; Bartl, U.; Bergauer, T.; Dragicevic, M.; Hacker, J.; König, A.; Wübben, T. Journal: Journal of instrumentation Issue: Volume 10:Number 5(2015:May) Page Start: C05007 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗