1. Characterization and compact modeling of short channel MOSFETs at cryogenic temperatures. (June 2023) Authors: Huang, Jixiang; Zhang, Yuanke; Chen, Yuefeng; Xu, Jun; Luo, Chao; Guo, Guoping Journal: Solid-state electronics Issue: Volume 204(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗