1. ASAP7: A 7-nm finFET predictive process design kit. (July 2016) Authors: Clark, Lawrence T.; Vashishtha, Vinay; Shifren, Lucian; Gujja, Aditya; Sinha, Saurabh; Cline, Brian; Ramamurthy, Chandarasekaran; Yeric, Greg Journal: Microelectronics journal Issue: Volume 53(2016) Page Start: 105 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗