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You searched for: Author/Creator Guiney, I.Limit your search
- Guiney, I. [remove] 1
- 621.381 1
- Electronics -- Periodicals 1
- leakage currents -- aluminium compounds -- gallium compounds -- III‐V semiconductors -- wide band gap semiconductors -- high electron mobility transistors -- silicon compounds -- passivation -- stress analysis -- plasma CVD 1
- stress impact -- ICP‐CVD passivation films -- HEMTs -- room temperature inductively coupled plasma chemical vapour deposited surface passivation layers -- off‐state drain -- SiNx -- temperature 293 K to 298 K -- size 2 mum -- strain engineered surface passivation approach -- subthreshold slope -- compressively stressed bilayer passivation scheme -- high electron mobility transistors -- gate leakage currents 1