1. A mapping study on mutation testing for mobile applications. (20th December 2021) Authors: Silva, Henrique Neves; Prado Lima, Jackson; Vergilio, Silvia Regina; Endo, Andre Takeshi Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A mutation framework for evaluating security analysis tools in IoT applications. (15th November 2021) Authors: Alalfi, Manar H.; Parveen, Sajeda; Nazzal, Bara' Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Assessing test suites of extended finite state machines against model‐ and code‐based faults. (18th August 2021) Authors: El‐Fakih, K.; Alzaatreh, Ayman; Türker, Uraz Cengiz Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. HOTFUZ: Cost‐effective higher‐order mutation‐based fault localization. (13th December 2021) Authors: Jang, Jong‐In; Ryu, Duksan; Baik, Jongmoon Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Issue Information. (4th October 2022) Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Issue Information. (9th November 2022) Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Learning‐based mutant reduction using fine‐grained mutation operators. (8th August 2021) Authors: Kim, Yunho; Hong, Shin Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. MuFBDTester: A mutation‐based test sequence generator for FBD programs implementing nuclear power plant software. (3rd May 2022) Authors: Liu, Lingjun; Jee, Eunkyoung; Bae, Doo‐Hwan Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Mutation analysis and its industrial applications. (5th August 2022) Authors: Gopinath, Rahul; Zhang, Jie M.; Kintis, Marinos; Papadakis, Mike Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Mutation analysis and its industrial applications. (8th August 2022) Authors: Gopinath, Rahul; Zhang, Jie M.; Kintis, Marinos; Papadakis, Mike Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗