1. Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices. (23rd September 2015) Authors: Haigh, Sarah J.; Rooney, Aidan P.; Prestat, Eric; Withers, Fred.; Del Pozo Zamudio, O.; Mishchenko, Artem; Gholinia, Ali.; Watanabe, K.; Taniguchi, T.; Tartakovskii, A. I.; Geim, Andre K.; Novoselov, Konstantin. S. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 107 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices. (August 2015) Authors: Haigh, Sarah J.; Rooney, Aidan P.; Prestat, Eric; Withers, Fred.; Del Pozo Zamudio, O.; Mishchenko, Artem; Gholinia, Ali.; Watanabe, K.; Taniguchi, T.; Tartakovskii, A. I.; Geim, Andre K.; Novoselov, Konstantin. S. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 107 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗