Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices. (23rd September 2015)

Record Type:
Journal Article
Title:
Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices. (23rd September 2015)
Main Title:
Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices
Authors:
Haigh, Sarah J.
Rooney, Aidan P.
Prestat, Eric
Withers, Fred.
Del Pozo Zamudio, O.
Mishchenko, Artem
Gholinia, Ali.
Watanabe, K.
Taniguchi, T.
Tartakovskii, A. I.
Geim, Andre K.
Novoselov, Konstantin. S.
Abstract:
Is Part Of:
Microscopy and microanalysis. Volume 21(2015:Jun.)Supplement 3
Journal:
Microscopy and microanalysis
Issue:
Volume 21(2015:Jun.)Supplement 3
Issue Display:
Volume 21, Issue 3 (2015)
Year:
2015
Volume:
21
Issue:
3
Issue Sort Value:
2015-0021-0003-0000
Page Start:
107
Page End:
108
Publication Date:
2015-09-23
Subjects:
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:
https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:
10.1017/S1431927615001336 ↗
Languages:
English
ISSNs:
1431-9276
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD Digital store
Ingest File:
549.xml