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You searched for: Author/Creator Genzel, Christoph

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1. A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction. Issue 3 (9th May 2018)

2. Application of a pnCCD for energy‐dispersive Laue diffraction with ultra‐hard X‐rays. (1st February 2016)

5. Diffusion-induced grain boundary migration as mechanism for grain growth and defect annihilation in chalcopyrite thin films. (1st June 2016)

6. Diffusion-induced grain boundary migration as mechanism for grain growth and defect annihilation in chalcopyrite thin films. (1st June 2016)

8. Energy‐dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra‐hard X‐ray synchrotron radiation. (25th July 2019)

10. Formation of CuInSe2 and CuGaSe2 Thin‐Films Deposited by Three‐Stage Thermal Co‐Evaporation: A Real‐Time X‐Ray Diffraction and Fluorescence Study. Issue 10 (26th June 2013)