Author/Creator: Geng, W.R. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Geng, W.R.

1. Charged domain wall modulation of resistive switching with large ON/OFF ratios in high density BiFeO3 nano-islands. (1st April 2020)

Authors:: Han, M.J.; Tang, Y.L.; Wang, Y.J.; Zhu, Y.L.; Ma, J.Y.; Geng, W.R.; Feng, Y.P.; Zou, M.J.; Zhang, N.B.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 187(2020)
Page Start:: 12
Record Type:: Journal Article
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2. Engineering antiferroelectric nucleation in ferroelectric films with enhanced piezoelectricity. (15th May 2023)

Authors:: Liu, S.Z.; Geng, W.R.; Tang, Y.L.; Zhu, Y.L.; Wang, Y.J.; Cao, Y.; Jiang, R.J.; Liu, N.; Gong, F.H.; Wang, J.H.; Lv, X.D.; Chen, S.J.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 250(2023)
Page Start:
Record Type:: Journal Article
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3. Flexoelectricity-induced retention failure in ferroelectric films. (1st September 2020)

Authors:: Zou, M.J.; Tang, Y.L.; Zhu, Y.L.; Wang, Y.J.; Feng, Y.P.; Han, M.J.; Zhang, N.B.; Ma, J.Y.; Geng, W.R.; Hu, W.T.; Guo, X.W.; Wu, B.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 196(2020)
Page Start:: 61
Record Type:: Journal Article
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4. Oxygen octahedral coupling mediated ferroelectric-antiferroelectric phase transition based on domain wall engineering. (1st October 2020)

Authors:: Geng, W.R.; Guo, X.W.; Zhu, Y.L.; Wang, Y.J.; Tang, Y.L.; Han, M.J.; Feng, Y.P.; Zou, M.J.; Wu, B.; Ma, J.Y.; Hu, W.T.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 198(2020)
Page Start:: 145
Record Type:: Journal Article
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5. Real-time observation of phase coexistence and a1/a2 to flux-closure domain transformation in ferroelectric films. (July 2020)

Authors:: Ma, J.Y.; Wang, Y.J.; Zhu, Y.L.; Tang, Y.L.; Han, M.J.; Zou, M.J.; Feng, Y.P.; Zhang, N.B.; Geng, W.R.; Wu, B.; Hu, W.T.; Guo, X.W.; Zhang, H.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 193(2020)
Page Start:: 311
Record Type:: Journal Article
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6. Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects. (March 2020)

Authors:: Geng, W.R.; Tian, X.H.; Jiang, Y.X.; Zhu, Y.L.; Tang, Y.L.; Wang, Y.J.; Zou, M.J.; Feng, Y.P.; Wu, B.; Hu, W.T.; Ma, X.L.
Journal:: Acta materialia
Issue:: Volume 186(2020)
Page Start:: 68
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗