1. Empirical model predicting the layer thickness and porosity of p-type mesoporous silicon. (8th March 2017) Authors: Wolter, Sascha J; Geisler, Dennis; Hensen, Jan; Köntges, Marc; Kajari-Schröder, Sarah; Bahnemann, Detlef W; Brendel, Rolf Journal: Semiconductor science and technology Issue: Volume 32:Number 4(2017:Apr.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗