Search
Search Constraints
You searched for: Author/Creator Frey, L. Journal Microelectronics and reliabilityLimit your search
- Microelectronics and reliability [remove]2
- Frey, L. [remove] 2
- 621.3815 2
- Appareils électroniques -- Fiabilité -- Périodiques 2
- Electronic apparatus and appliances -- Reliability 2
- Electronic apparatus and appliances -- Reliability -- Periodicals 2
- Miniature electronic equipment 2
- Miniature electronic equipment -- Periodicals 2
- Periodicals 2
- Équipement électronique miniaturisé -- Périodiques 2
- MIS -- Fowler–Nordheim -- Poole–Frenkel -- Temperature dependence -- Current conduction mechanisms -- Optimization method 1
- Normalized Differential Conductance (NDC) -- Conduction mechanism -- Parameter extractions -- MOS device -- Fowler–Nordheim -- Poole–Frenkel 1