Author/Creator: Fouquet, F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Fouquet, F.

1. Electrical predictive model of Zener diode under pulsed EOS. Issue 4 (1st February 2015)

Authors:: Zhu, F.; Ravelo, B.; Fouquet, F.; Kadi, M.
Journal:: Electronics letters
Issue:: Volume 51:Issue 4(2015)
Page Start:: 327
Record Type:: Journal Article
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2. Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests. (September 2018)

Authors:: Fu, J.Z.; Fouquet, F.; Kadi, M.; Dherbécourt, P.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 652
Record Type:: Journal Article
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3. Gate oxide degradation of SiC MOSFET under short-circuit aging tests. (September 2016)

Authors:: Mbarek, S.; Fouquet, F.; Dherbecourt, P.; Masmoudi, M.; Latry, O.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 415
Record Type:: Journal Article
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4. Gate oxide degradation of SiC MOSFET under short-circuit aging tests. (September 2016)

Authors:: Mbarek, S.; Fouquet, F.; Dherbecourt, P.; Masmoudi, M.; Latry, O.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 415
Record Type:: Journal Article
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5. Short-circuit robustness test and in depth microstructural analysis study of SiC MOSFET. (September 2017)

Authors:: Mbarek, S.; Dherbécourt, P.; Latry, O.; Fouquet, F.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 527
Record Type:: Journal Article
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