1. A detailed view of the Gaussian–Lorentzian sum and product functions and their comparison with the Voigt function. (16th December 2021) Authors: Major, George H.; Fernandez, Vincent; Fairley, Neal; Linford, Matthew R. Journal: Surface and interface analysis Issue: Volume 54:Number 3(2022) Page Start: 262 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. An experimental investigation of diesel soot thermal-induced oxidation based on the chemical structure evolution. (March 2022) Authors: Guo, Yi; Horchler, Eva J.; Fairley, Neal; Stevanovic, Svetlana; Shang, Jing; Ristovski, Zoran Journal: Carbon Issue: Volume 188(2022) Page Start: 246 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Application of XPS imaging analysis in understanding interfacial delamination and X‐ray radiation degradation of PMMA. (18th October 2013) Authors: Piao, Hong; Fairley, Neal; Walton, John Journal: Surface and interface analysis Issue: Volume 45:Number 11/12(2013:Nov.) Page Start: 1742 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Application of XPS imaging analysis in understanding interfacial delamination and X‐ray radiation degradation of PMMA. (8th August 2013) Authors: Piao, Hong; Fairley, Neal; Walton, John Journal: Surface and interface analysis Issue: Volume 45:Number 11/12(2013:Nov.) Page Start: 1742 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching. (11th November 2021) Authors: Ettouri, Rim; Tillocher, Thomas; Lefaucheux, Philippe; Boutaud, Bertrand; Fernandez, Vincent; Fairley, Neal; Cardinaud, Christophe; Girard, Aurélie; Dussart, Rémi Journal: Surface and interface analysis Issue: Volume 54:Number 2(2022) Page Start: 134 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Definition of a new (Doniach‐Sunjic‐Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. (18th October 2021) Authors: Moeini, Behnam; Linford, Matthew R.; Fairley, Neal; Barlow, Anders; Cumpson, Peter; Morgan, David; Fernandez, Vincent; Baltrusaitis, Jonas Journal: Surface and interface analysis Issue: Volume 54:Number 1(2022) Page Start: 67 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Developments in numerical treatments for large data sets of XPS images. (25th February 2016) Authors: Béchu, Solène; Richard‐Plouet, Mireille; Fernandez, Vincent; Walton, John; Fairley, Neal Other Names: Artyushkova Kateryna guestEditor. Journal: Surface and interface analysis Issue: Volume 48:Number 5(2016) Page Start: 301 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Graphite-supported ultra-small copper nanoparticles – Preparation, characterization and catalysis applications. (November 2015) Authors: d'Halluin, Martin; Mabit, Thibaud; Fairley, Neal; Fernandez, Vincent; Gawande, Manoj B.; Le Grognec, Erwan; Felpin, François-Xavier Journal: Carbon Issue: Volume 93(2015) Page Start: 974 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Graphite-supported ultra-small copper nanoparticles – Preparation, characterization and catalysis applications. (November 2015) Authors: d'Halluin, Martin; Mabit, Thibaud; Fairley, Neal; Fernandez, Vincent; Gawande, Manoj B.; Le Grognec, Erwan; Felpin, François-Xavier Journal: Carbon Issue: Volume 93(2015) Page Start: 974 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS). (22nd October 2021) Authors: Unger, Wolfgang E. S.; Senoner, Mathias; Stockmann, Jörg M.; Fernandez, Vincent; Fairley, Neal; Passiu, Cristiana; Spencer, Nicholas D.; Rossi, Antonella Other Names: Gilmore Ian S. guestEditor.; Watts John F. guestEditor. Journal: Surface and interface analysis Issue: Volume 54:Number 4(2022) Page Start: 320 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗