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- Enz, Christian [remove] 4
- 621.38152 3
- Semiconducteurs -- Périodiques 3
- Semiconductors -- Periodicals 3
- 28 nm FDSOI -- Characterization -- Cryogenic CMOS -- Cryogenic MOSFET -- Double-gate -- Low temperature -- Mobility -- Modeling -- 4.2 K 1
- 621.384 1
- Charge-based modeling -- Charge-trapping -- Defects -- Device reliability -- EKV -- Interface traps -- Mobile charge linearization -- Oxide-trapped charges -- 28-nm bulk MOSFETs -- Radiation damage -- Total ionizing dose 1
- Double-gate -- FDSOI -- Gate coupling -- Interface states -- MOSFET -- Subthreshold swing 1
- Internet of things 1
- Radio frequency modulation -- Transmitters and transmission 1
- Ultra-wideband communication systems 1