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5. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

6. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

7. Europium‐doped GaN(Mg): beyond the limits of the light‐emitting diode. Issue 3 (7th February 2014)