1. Accurate and precise E‐field measurement for 2G and 3G networks based on IEEE Std. 1309‐2013. Issue 7 (July 2015) Authors: Narang, Naina; Dubey, Satya Kesh; Negi, P. S.; Ojha, V. N. Journal: Microwave and optical technology letters Issue: Volume 57:Issue 7(2015:Jul.) Page Start: 1645 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Distinction between double electromagnetically induced transparency and double Autler–Townes splitting in RF-driven four-level ladder 87Rb atomic vapor. (6th July 2018) Authors: Rawat, Harish Singh; Dubey, Satya Kesh; Ojha, Vijay Narain Journal: Journal of physics Issue: Volume 51:Number 15(2018:Aug. 01) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. LabVIEW based Automation Guide for Microwave Measurements. (2017) Authors: Dubey, Satya Kesh; Narang, Naina; Negi, P. S; Ojha, V. N Record Type: Book Extent: 1 online resource (56 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗