Accurate and precise E‐field measurement for 2G and 3G networks based on IEEE Std. 1309‐2013. Issue 7 (July 2015)

• Record Type: Journal Article
• Authors: Narang, Naina; Dubey, Satya Kesh; Negi, P. S.; Ojha, V. N.
• Is Part Of: Microwave and optical technology letters. Volume 57:Issue 7(2015:Jul.)
• Page Start: 1645
• Page End: 1649
• Publication Date: 2015-07
• Subjects: Microwaves -- Periodicals; Optics -- Periodicals; 621
• DOI: 10.1002/mop.29143
• Languages: English
• ISSNs: 0895-2477

Abstract

<abstract abstract-type="main"> <title>ABSTRACT</title> <p>This article elaborates the theoretical and measurement technique to evaluate precise and accurate electric (E)‐field strength for frequency range 0.8–2.4 GHz (2G and 3G communication spectrum). The E‐field using a probe is precisely measured inside an indigenously designed transverse electromagnetic (TEM) cell as per IEEE Std. 1309‐2013. Key parameters for precise E‐ field measurement are explicated with their measurement results such as probe linearity, field distortion, and mismatch losses. E‐field strength of probe has been reported 9.91 V/m with an expanded uncertainty (k ∼ 2) of ±0.58 V/m for +18 dBm fed power at 915 MHz frequency. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1645–1649, 2015</p> </abstract>