1. High resolution scanning near field mapping of enhancement on SERS substrates: comparison with photoemission electron microscopy. Issue 14 (16th March 2016) Authors: Awada, C.; Plathier, J.; Dab, C.; Charra, F.; Douillard, L.; Ruediger, A. Journal: Physical chemistry chemical physics Issue: Volume 18:Issue 14(2016) Page Start: 9405 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗