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- Dong, Xingchen [remove] 20
- 540 4
- 621.05 4
- Chemistry -- Periodicals 4
- Physics -- Periodicals 4
- Technology -- Periodicals 2
- 2D materials -- diffraction‐limited imaging -- optoelectronics -- spectroscopy 1
- 2D semiconductors -- classification -- detection -- large‐area identification -- machine learning -- microscopic imagery -- segmentation 1
- 3E system -- Coordination -- Development speed -- Spatial econometric analysis -- Principal component analysis -- Sustainability 1
- 507.21 1
- 534.5 1