1. Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /: proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. (2017) Other Names: Donecker, J; Rechenberg, I; International Conference on Defect Recognition and Image Processing in Semiconductors, 7th Record Type: Book Extent: 1 online resource (524 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗