Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /: proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. (2017)

• Record Type: Book
• Further Information: Note: Edited by J. Donecker and I. Rechneberg.
• Other Names: Donecker, J; Rechenberg, I; International Conference on Defect Recognition and Image Processing in Semiconductors, 7th
• Publisher Details: Place of publication not identified : Routledge
• Publication Date: 2017
• Extent: 1 online resource (524 pages)
• Subjects: 621.3815/2; Semiconductors -- Defects -- Congresses; Image processing -- Congresses; Image processing; Semiconductors -- Defects; Semiconducteurs -- Défauts -- Congrès; Image, Traitement des -- Congrès; Conference papers and proceedings
• Languages: English
• ISBNs: 9781351456463; 1351456466
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.