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Author/Creator Dolabella, Simone

1. HRXRD and micro-CT multiscale investigation of stress and defects induced by a novel packaging design for MEMS sensors. (December 2022)

Authors:
Borzì, Aurelio; Zboray, Robert; Dolabella, Simone; Brun, Sébastien; Telmont, Florian; Kupferschmied, Peter; Néal, Jean-François Le; Drljaca, Pedrag; Fiorucci, Gianni; Dommann, Alex; Neels, Antonia
Journal:
Applied materials today
Issue:
Volume 29(2022)
Page Start:
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

4. Real‐ and Q‐space travelling: multi‐dimensional distribution maps of crystal‐lattice strain (ϵ044) and tilt of suspended monolithic silicon nanowire structures. Issue 1 (18th December 2019)

Authors:
Dolabella, Simone; Frison, Ruggero; Chahine, Gilbert A.; Richter, Carsten; Schulli, Tobias U.; Tasdemir, Zuhal; Alaca, B. Erdem; Leblebici, Yusuf; Dommann, Alex; Neels, Antonia
Journal:
Journal of applied crystallography
Issue:
Volume 53:Issue 1(2020)
Page Start:
58
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗