1. Effects of surface nature of different semiconductor substrates on the plasma enhanced atomic layer deposition growth of Al2O3 gate dielectric thin films. Issue 7 (5th June 2015) Authors: Schilirò, Emanuela; Greco, Giuseppe; Fiorenza, Patrick; Tudisco, Cristina; Condorelli, Guglielmo Guido; Di Franco, Salvatore; Roccaforte, Fabrizio; Lo Nigro, Raffaella; Hoffmann, Patrik; Knez, Mato; Vahlas, Constantin; Alexandrov, Sergei Journal: Physica status solidi Issue: Volume 12:Issue 7(2015:Jul.) Page Start: 980 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Effects of surface nature of different semiconductor substrates on the plasma enhanced atomic layer deposition growth of Al2O3 gate dielectric thin films. Issue 7 (5th June 2015) Authors: Schilirò, Emanuela; Greco, Giuseppe; Fiorenza, Patrick; Tudisco, Cristina; Condorelli, Guglielmo Guido; Di Franco, Salvatore; Roccaforte, Fabrizio; Lo Nigro, Raffaella; Hoffmann, Patrik; Knez, Mato; Vahlas, Constantin; Alexandrov, Sergei Journal: Physica status solidi Issue: Volume 12:Issue 7(2015:Jul.) Page Start: 980 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electrical and structural properties of Ti/Al‐based contacts on AlGaN/GaN heterostructures with different quality. Issue 5 (26th January 2015) Authors: Greco, Giuseppe; Iucolano, Ferdinando; Bongiorno, Corrado; Di Franco, Salvatore; Lo Nigro, Raffaella; Giannazzo, Filippo; Prystawko, Pawel; Kruszewski, Piotr; Krysko, Marcin; Grzanka, Ewa; Leszczynski, Michał; Tudisco, Cristina; Condorelli, Guglielmo Guido; Roccaforte, Fabrizio Journal: Physica status solidi Issue: Volume 212:Issue 5(2015:May) Page Start: 1091 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Electrical characterization of trapping phenomena at SiO2/SiC and SiO2/GaN in MOS‐based devices. Issue 4 (21st October 2016) Authors: Fiorenza, Patrick; Greco, Giuseppe; Vivona, Marilena; Giannazzo, Filippo; Di Franco, Salvatore; Frazzetto, Alessia; Guarnera, Alfio; Saggio, Mario; Iucolano, Ferdinando; Patti, Alfonso; Roccaforte, Fabrizio Journal: Physica status solidi Issue: Volume 214:Issue 4(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy. (15th January 2020) Authors: Giannazzo, Filippo; Greco, Giuseppe; Di Franco, Salvatore; Fiorenza, Patrick; Deretzis, Ioannis; La Magna, Antonino; Bongiorno, Corrado; Zimbone, Massimo; La Via, Francesco; Zielinski, Marcin; Roccaforte, Fabrizio Journal: Advanced Electronic Materials Issue: Volume 6:Number 2(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Modification of the sheet resistance under Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructures. (May 2018) Authors: Spera, Monia; Miccoli, Cristina; Nigro, Raffaella Lo; Bongiorno, Corrado; Corso, Domenico; Di Franco, Salvatore; Iucolano, Ferdinando; Roccaforte, Fabrizio; Greco, Giuseppe Journal: Materials science in semiconductor processing Issue: Volume 78(2018) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Nanoscale electrical characterization of graphene contacts to AlGaN/GaN heterostructures. Issue 11 (10th October 2014) Authors: Fisichella, Gabriele; Greco, Giuseppe; Di Franco, Salvatore; Roccaforte, Fabrizio; Ravesi, Sebastiano; Giannazzo, Filippo; Pizzini, Sergio; Kissinger, Gudrun Journal: Physica status solidi Issue: Volume 11:Issue 11/12(2014) Page Start: 1551 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Nanoscale probing of the lateral homogeneity of donors concentration in nitridated SiO2/4H–SiC interfaces. (21st June 2016) Authors: Fiorenza, Patrick; Di Franco, Salvatore; Giannazzo, Filippo; Roccaforte, Fabrizio Journal: Nanotechnology Issue: Volume 27:Number 31(2016) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Silicon doped by molecular doping technique: Role of the surface layers of doped Si on the electrical characteristics. (February 2016) Authors: Caccamo, Sebastiano; Puglisi, Rosaria A.; Di Franco, Salvatore; D'Urso, Luisa; Indelicato, Valeria; Italia, Markus; Pannitteri, Salvatore; La Magna, Antonino Journal: Materials science in semiconductor processing Issue: Volume 42:Part 2(2016:Feb.) Page Start: 200 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Spontaneous galvanic displacement of Pt nanostructures on nickel foam: Synthesis, characterization and use for hydrogen evolution reaction. (19th April 2018) Authors: Milazzo, Rachela G.; Privitera, Stefania M.S.; D'Angelo, Daniele; Scalese, Silvia; Di Franco, Salvatore; Maita, Francesco; Lombardo, Salvatore Journal: International journal of hydrogen energy Issue: Volume 43:Number 16(2018) Page Start: 7903 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗