1. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (13th March 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (13th March 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (13th March 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (13th March 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. (21st May 2023) Authors: Arrighi, Aloïs; Ullberg, Nathan; Derycke, Vincent; Grévin, Benjamin Journal: Nanotechnology Issue: Volume 34:Number 21(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗