1. A baseline drift detrending technique for fast scan cyclic voltammetry. Issue 22 (24th October 2017) Authors: DeWaele, Mark; Oh, Yoonbae; Park, Cheonho; Kang, Yu Min; Shin, Hojin; Blaha, Charles D.; Bennet, Kevin E.; Kim, In Young; Lee, Kendall H.; Jang, Dong Pyo Journal: Analyst Issue: Volume 142:Issue 22(2017) Page Start: 4317 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗