1. (Invited) Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates. (13th April 2015) Authors: Kirste, Lutz; Danilewsky, Andreas N.; Sochacki, Tomasz; Köhler, Klaus; Zajac, Marcin; Kucharski, Robert; Boćkowski, Michal; McNally, Patrick J. Journal: ECS transactions Issue: Volume 66:Number 1(2015) Page Start: 93 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analysis of c-lattice parameters to evaluate Na2O loss from and Na2O content in β''-alumina ceramics. Issue 10 (15th May 2021) Authors: Bay, Marie-Claude; Heinz, Meike V.F.; Danilewsky, Andreas N.; Battaglia, Corsin; Vogt, Ulrich F. Journal: Ceramics international Issue: Volume 47:Issue 10(2021)Part A Page Start: 13402 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Anisotropic Microsegregation in the Growth of Doped III‐V‐Semiconductors from Solution. Issue 5 (24th April 2018) Authors: Danilewsky, Andreas N.; Meinhardt, Jens; Boschert, Stefan; Bischopink, Georg Journal: Crystal research and technology Issue: Volume 53:Issue 5(2018) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals. Issue 4 (12th June 2020) Authors: Gradwohl, Kevin-P.; Danilewsky, Andreas N.; Roder, Melissa; Schmidbauer, Martin; Janicskó-Csáthy, József; Gybin, Alexander; Abrosimov, Nikolay; Sumathi, R. Radhakrishnan Journal: Journal of applied crystallography Issue: Volume 53:Issue 4(2020) Page Start: 880 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Experimental impact cratering: A summary of the major results of the MEMIN research unit. (16th February 2018) Authors: Kenkmann, Thomas; Deutsch, Alex; Thoma, Klaus; Ebert, Matthias; Poelchau, Michael H.; Buhl, Elmar; Carl, Eva‐Regine; Danilewsky, Andreas N.; Dresen, Georg; Dufresne, Anja; Durr, Nathanaël; Ehm, Lars; Grosse, Christian; Gulde, Max; Güldemeister, Nicole; Hamann, Christopher; Hecht, Lutz; Hiermaier,... Journal: Meteoritics & planetary science Issue: Volume 53:Number 8(2018) Page Start: 1543 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Investigation of the dislocation structure in Czochralski germanium crystals grown in [211] and [110] growth directions. Issue 23 (21st May 2021) Authors: Gradwohl, Kevin-P.; Roder, Melissa; Danilewsky, Andreas N.; Sumathi, R. Radhakrishnan Journal: CrystEngComm Issue: Volume 23:Issue 23(2021) Page Start: 4116 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage. (2016) Authors: Rack, Alexander; Scheelb, Mario; Danilewsky, Andreas N. Journal: IUCrJ Issue: Volume 3:Part 2(2016) Page Start: 108 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Single‐crystal sapphire microstructure for high‐resolution synchrotron X‐ray monochromators page 290–298 by Raphaël P. Hermann et al. Issue 4 (April 2016) Authors: Asadchikov, Victor E.; Butashin, Andrey V.; Buzmakov, Alexey V.; Deryabin, Alexander N.; Kanevsky, Vladimir M.; Prokhorov, Igor A.; Roshchin, Boris S.; Volkov, Yuri O.; Zolotov, Denis A.; Jafari, Atefeh; Alexeev, Pavel; Cecilia, Angelica; Baumbach, Tilo; Bessas, Dimitrios; Danilewsky, Andreas N.;... Journal: Crystal research and technology Issue: Volume 51:Issue 4(2016) Page Start: 243 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Single‐crystal sapphire microstructure for high‐resolution synchrotron X‐ray monochromators. Issue 4 (22nd March 2016) Authors: Asadchikov, Victor E.; Butashin, Andrey V.; Buzmakov, Alexey V.; Deryabin, Alexander N.; Kanevsky, Vladimir M.; Prokhorov, Igor A.; Roshchin, Boris S.; Volkov, Yuri O.; Zolotov, Denis A.; Jafari, Atefeh; Alexeev, Pavel; Cecilia, Angelica; Baumbach, Tilo; Bessas, Dimitrios; Danilewsky, Andreas N.;... Journal: Crystal research and technology Issue: Volume 51:Issue 4(2016) Page Start: 290 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. X-ray imaging of silicon die within fully packaged semiconductor devices. Issue 2 (June 2021) Authors: Tanner, Brian K.; McNally, Patrick J.; Danilewsky, Andreas N. Journal: Powder diffraction Issue: Volume 36:Issue 2(2021) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗