1. (Invited) Comprehensive Assessment of Oxide Memristors As Post-CMOS Memory and Logic Devices. (25th April 2016) Authors: Gao, Xujiao; Mamaluy, Denis; Cyr, Eric C.; Marinella, Matthew J. Journal: ECS transactions Issue: Volume 72:Number 3(2016) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗