1. In situ bending of an Au nanowire monitored by micro Laue diffraction. (1st February 2015) Authors: Leclere, Cédric; Cornelius, Thomas W.; Ren, Zhe; Davydok, Anton; Micha, Jean‐Sébastien; Robach, Odile; Richter, Gunther; Belliard, Laurent; Thomas, Olivier Journal: Journal of applied crystallography Issue: Volume 48:Part 1(2015:Feb.) Page Start: 291 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques. Issue 1712 (14th October 2014) Authors: Cornelius, Thomas W.; Ren, Zhe; Mastropietro, Francesca; Langlais, Simon; Davydok, Anton; Richard, Marie-Ingrid; Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume; Boesecke, Peter; Thomas, Olivier Editors: Barber, A.; Boulle, A.; Kim, Y.; Wong, S.S. Journal: MRS proceedings Issue: Issue 1712:(2014) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. In‐situ force measurement during nano‐indentation combined with Laue microdiffraction. Issue 1 (21st October 2020) Authors: Lauraux, Florian; Yehya, Sarah; Labat, Stéphane; Micha, Jean‐Sébastien; Robach, Odile; Kovalenko, Oleg; Rabkin, Eugen; Thomas, Olivier; Cornelius, Thomas W. Journal: Nano select Issue: Volume 2:Issue 1(2021) Page Start: 99 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Load versus displacement-controlled nanocompression: Insights from atomistic simulations. (15th March 2023) Authors: Iteney, Hugo; Cornelius, Thomas W.; Thomas, Olivier; Amodeo, Jonathan Journal: Scripta materialia Issue: Number 226(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales. (May 2018) Authors: Cornelius, Thomas W.; Thomas, Olivier Journal: Progress in materials science Issue: Volume 94(2018) Page Start: 384 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Scanning force microscope for in situ nanofocused X‐ray diffraction studies. (7th August 2014) Authors: Ren, Zhe; Mastropietro, Francesca; Davydok, Anton; Langlais, Simon; Richard, Marie‐Ingrid; Furter, Jean‐Jacques; Thomas, Olivier; Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume; Boesecke, Peter; Cornelius, Thomas W. Journal: Journal of synchrotron radiation Issue: Volume 21:Part 5(2014) Page Start: 1128 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Selective growth of ordered hexagonal InN nanorods. Issue 16 (1st April 2019) Authors: Zeghouane, Mohammed; Avit, Geoffrey; Cornelius, Thomas W.; Salomon, Damien; André, Yamina; Bougerol, Catherine; Taliercio, Thierry; Meguekam-Sado, Ariane; Ferret, Pierre; Castelluci, Dominique; Gil, Evelyne; Tournié, Eric; Thomas, Olivier; Trassoudaine, Agnès Journal: CrystEngComm Issue: Volume 21:Issue 16(2019) Page Start: 2702 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping. Issue 6 (21st January 2020) Authors: Richard, Marie‐Ingrid; Cornelius, Thomas W.; Lauraux, Florian; Molin, Jean‐Baptiste; Kirchlechner, Christoph; Leake, Steven J.; Carnis, Jérôme; Schülli, Tobias U.; Thilly, Ludovic; Thomas, Olivier Journal: Small Issue: Volume 16:Issue 6(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗