1. The current and capacitance characteristics as a function of sample temperature in YMn0.90Os0.10O3/p-Si structures. (1st November 2019) Authors: Coșkun, M.; Polat, O.; Coșkun, F.M.; Efeoğlu, H.; Caglar, M.; Durmus, Z.; Turut, A. Journal: Materials science in semiconductor processing Issue: Volume 102(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗