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You searched for: Author/Creator Ciston, Jim

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1. Probing Local Electronic Transitions in Organic Semiconductors through Energy‐Loss Spectrum Imaging in the Transmission Electron Microscope. (2nd September 2015)

2. Functional Materials Under Stress: In Situ TEM Observations of Structural Evolution. Issue 27 (20th November 2019)

3. Search for meteoritic GEMS I: Comparison of amorphous silicates in Paris and Acfer 094 chondrite matrices and in anhydrous chondritic interplanetary dust particles. (1st October 2021)

4. Py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis. (August 2021)

5. Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization. (August 2021)

9. The 4D Camera: Very High Speed Electron Counting for 4D-STEM. (August 2019)