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Author/Creator Chun, Jungu

2. Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials. (24th June 2021)

Authors:
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz‐Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon ...
Journal:
Advanced Electronic Materials
Issue:
Volume 7:Number 9(2021)
Page Start:
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Record Type:
Journal Article
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3. Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET. (29th January 2021)

Authors:
Lee, Kookjin; Kim, Yeonsu; Lee, Hyebin; Park, Sojeong; Lee, Yongwoo; Joo, Min-Kyu; Ji, Hyunjin; Lee, Jaewoo; Chun, Jungu; Sung, Moonsoo; Cho, Young-Hoon; Kim, Doyoon; Choi, Junhee; Lee, Jae Woo; Jeon, Dae-Young; Choi, Sung-Jin; Kim, Gyu-Tae
Journal:
Nanotechnology
Issue:
Volume 32:Number 16(2021)
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Record Type:
Journal Article
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4. Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor. (1st April 2021)

Authors:
Lee, Kookjin; Choi, Junhee; Kaczer, Ben; Grill, Alexander; Lee, Jae Woo; Van Beek, Simon; Bury, Erik; Diaz‐Fortuny, Javier; Chasin, Adrian; Lee, Jaewoo; Chun, Jungu; Shin, Dong Hoon; Na, Junhong; Cho, Hyeran; Lee, Sang Wook; Kim, Gyu‐Tae
Journal:
Advanced functional materials
Issue:
Volume 31:Number 23(2021)
Page Start:
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Record Type:
Journal Article
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