Author/Creator: Chen, C.Q. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Chen, C.Q.

1. Amplitude-dependent boundary modes in topological mechanical lattices. (August 2021)

Authors:: Zhou, Yuan; Zhang, Yafei; Chen, C.Q.
Journal:: Journal of the mechanics and physics of solids
Issue:: Volume 153(2021)
Page Start:
Record Type:: Journal Article
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2. Analytical solutions for elastic response of coated mesoporous materials to pore pressure. (October 2016)

Authors:: Liu, Mingchao; Zhang, Yafei; Wu, Jian; Gan, Yixiang; Chen, C.Q.
Journal:: International journal of engineering science
Issue:: Volume 107(2016:Oct.)
Page Start:: 68
Record Type:: Journal Article
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3. Analytical solutions for elastic response of coated mesoporous materials to pore pressure. (October 2016)

Authors:: Liu, Mingchao; Zhang, Yafei; Wu, Jian; Gan, Yixiang; Chen, C.Q.
Journal:: International journal of engineering science
Issue:: Volume 107(2016:Oct.)
Page Start:: 68
Record Type:: Journal Article
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4. Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. (September 2016)

Authors:: Zhao, Y.Z.; Wang, Q.J.; Tan, P.K.; Yap, H.H.; Liu, B.H.; Feng, H.; Tan, H.; He, R.; Huang, Y.M.; Wang, D.D.; Zhu, L.; Chen, C.Q.; Rivai, F.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 362
Record Type:: Journal Article
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5. Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. (September 2016)

Authors:: Zhao, Y.Z.; Wang, Q.J.; Tan, P.K.; Yap, H.H.; Liu, B.H.; Feng, H.; Tan, H.; He, R.; Huang, Y.M.; Wang, D.D.; Zhu, L.; Chen, C.Q.; Rivai, F.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 362
Record Type:: Journal Article
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6. Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. (September 2017)

Authors:: Chen, C.Q.; Ang, G.B.; Ng, P.T.; Rivai, Francis; Neo, S.P.; Nagalingam, D.; Yip, K.H.; Lam, Jeffery; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 141
Record Type:: Journal Article
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7. Assessing adhesion and glue-line defects in cold-pressing lamination of glubam. (8th March 2021)

Authors:: Shan, B.; Chen, C.Q.; Deng, J.Y.; Li, T.Y.; Xiao, Y.
Journal:: Construction & building materials
Issue:: Volume 274(2021)
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Record Type:: Journal Article
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8. Bistability-based foldable origami mechanical logic gates. (February 2021)

Authors:: Meng, Zhiqiang; Chen, Weitong; Mei, Tie; Lai, Yuchen; Li, Yixiao; Chen, C.Q.
Journal:: Extreme mechanics letters
Issue:: Volume 43(2021)
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Record Type:: Journal Article
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9. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016)

Authors:: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 321
Record Type:: Journal Article
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10. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016)

Authors:: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 321
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗